• DocumentCode
    359047
  • Title

    Recursive data-based prediction and control of product quality for a batch PMMA reactor

  • Author

    Pan, Yangdong ; Lee, Jay H.

  • Author_Institution
    Sch. of Chem. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    3
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1747
  • Abstract
    In many batch processes, frequent process/feedstock disturbances and unavailability of online measurements make tight control of product quality very difficult. Motivated by this, we present a simple data-based method in which measurements of other process variables are related to the end product quality using a historical database. The developed correlation model is used to make online predictions of the end quality, which can serve as a basis for adjusting the batch condition/time so that desired product quality may be achieved. This strategy is applied to a methyl methacrylate (MMA) polymerization process. Important end quality variables, the weight average molecular weight and the polydispersity, are predicted recursively based on the measurements of the reactor cooling rate. Subsequently, a shrinking-horizon model predictive control approach is used to manipulate the reaction temperature. The results in this study show much promise for the proposed data-based inferential control method
  • Keywords
    batch processing (industrial); chemical technology; polymerisation; predictive control; process control; quality control; temperature control; batch PMMA reactor; correlation model; data-based inferential control method; historical database; methyl methacrylate polymerization process; polydispersity; product quality; reaction temperature; reactor cooling rate; recursive data-based prediction; shrinking-horizon model predictive control; weight average molecular weight; Chemical engineering; Cooling; Electronic mail; Inductors; Polymers; Predictive models; Pressure control; Process control; Quality control; Temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2000. Proceedings of the 2000
  • Conference_Location
    Chicago, IL
  • ISSN
    0743-1619
  • Print_ISBN
    0-7803-5519-9
  • Type

    conf

  • DOI
    10.1109/ACC.2000.879501
  • Filename
    879501