Analysis of line current wave diffraction from metal-backed dielectric strip by extended PO method

We present the modified physical optics (PO) analysis of line current wave scattering by planar metal-backed dielectric strips. The effects of dielectric coatings on the reflecting properties of planar strips are analyzed in the detail including the differences of pattern shape and null points´ shift in the cases of E- and H-polarized scattering. It is shown that changing the dielectric permittivity and thickness of a coating may result in substantial pattern shape transformation for the same width of a reflector aperture. The robustness of proposed approach can also be used for studying the scattering properties of thin multilayered and varying thickness coatings by applying the corresponding expressions for the reflection coefficient