DocumentCode :
35907
Title :
Suspended Large-Area MEMS-Based Optical Filters for Multispectral Shortwave Infrared Imaging Applications
Author :
Tripathi, Dhirendra Kumar ; Fei Jiang ; Rafiei, Ramin ; Dilusha Silva, K.K.M.B. ; Antoszewski, Jarek ; Martyniuk, Mariusz ; Dell, John M. ; Faraone, Lorenzo
Author_Institution :
Sch. of Electr., Univ. of Western Australia, Perth, WA, Australia
Volume :
24
Issue :
4
fYear :
2015
fDate :
Aug. 2015
Firstpage :
1102
Lastpage :
1110
Abstract :
We present the design, fabrication, and optical and mechanical characterization of silicon-/silicon-oxide-based optical filters and distributed Bragg reflectors in sizes ranging from 500 μm × 500 μm to 5 mm × 5 mm. They are designed to be used in conjunction with either single-element photodetectors or large-area focal plane arrays to realize tunable multispectral sensors or adaptive focal plane arrays in the shortwave infrared wavelength range. Surface optical profile measurements indicate a flatness of the order of 30 nm in the fabricated structures across several millimeters. Single-point spectral measurements on devices show an excellent agreement with simulated optical models, and demonstrate Si-SiOx-Si fixed optical filters with a 94% transmission at 1940 nm with a full-width at half-maximum of 250 nm. Distributed Bragg reflectors demonstrate 90% reflectance across the 1560-2050-nm wavelength range, making them suitable as broadband reflectors. The optical spatial uniformity across a 3-mm × 3-mm device shows only a 3% variation across the entire optically active area. Finally, the mechanical resonance characteristic of a 1-mm x 1-mm fabricated device shows the lowest resonant frequency of the suspended structure to be 39 kHz, indicating excellent immunity to extraneous low-frequency vibrations.
Keywords :
distributed Bragg reflectors; elemental semiconductors; focal planes; micro-optics; microsensors; optical filters; photodetectors; silicon; silicon compounds; Si-SiOx-Si; distributed Bragg reflectors; large-area focal plane arrays; mechanical resonance characteristic; multispectral sensors; multispectral shortwave infrared imaging applications; optical spatial uniformity; resonant frequency; silicon-/silicon-oxide-based optical filters; single-element photodetectors; surface optical profile measurements; suspended large-area MEMS-based optical filters; transmission; wavelength 1940 nm; Integrated optics; Optical device fabrication; Optical filters; Optical imaging; Optical refraction; Optical variables measurement; Silicon; Distributed Bragg reflector; Fabry-Perot; focal plane array; optical filter; shortwave infrared; shortwave infrared.;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/JMEMS.2014.2385081
Filename :
7021913
Link To Document :
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