• DocumentCode
    3591050
  • Title

    Design, analysis and fabrication of MEMS-based silicon microneedles for bio-medical applications

  • Author

    Ashraf, M.W. ; Tayyaba, S. ; Afzulpurkar, N. ; Lomas, T. ; Tuantranont, A. ; Nisar, A. ; Bohez, E.L.J.

  • Author_Institution
    Sch. of Eng. & Technol., Asian Inst. of Technol. (AIT), Bangkok, Thailand
  • fYear
    2010
  • Firstpage
    950
  • Lastpage
    953
  • Abstract
    In this paper we present the design, analysis and fabrication of silicon hollow out-of-plane microneedles for transdermal drug delivery (TDD) applications. The fabrication process of silicon microneedles involves combination of isotropic and anisotropic etching process using inductively coupled plasma (ICP) etching technology. Finite Element Analysis (FEA) using ANSYS rather than analytical system has been used to perform the structural analysis. The effect of axial and transverse load on the microneedles during skin insertion is investigated in the stress analysis. The analysis predicts that the resultant stresses due to applied bending and axial loads are in the safe range below the yield strength of the material.
  • Keywords
    bending; bioMEMS; drug delivery systems; finite element analysis; internal stresses; microfabrication; silicon; skin; sputter etching; yield strength; ANSYS; MEMS-based silicon hollow out-of-plane microneedles; anisotropic etching process; applied bending; axial effect; axial loads; biomedical applications; finite element analysis; inductively coupled plasma etching technology; isotropic etching process; skin insertion; stress analysis; structural analysis; transdermal drug delivery applications; transverse load; yield strength; Anisotropic magnetoresistance; Drug delivery; Etching; Fabrication; Finite element methods; Performance analysis; Pharmaceutical technology; Plasma applications; Silicon; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Engineering/Electronics Computer Telecommunications and Information Technology (ECTI-CON), 2010 International Conference on
  • Print_ISBN
    978-1-4244-5606-2
  • Electronic_ISBN
    978-1-4244-5607-9
  • Type

    conf

  • Filename
    5491564