DocumentCode :
3591070
Title :
TTTC: Test technology technical council
fYear :
2015
Firstpage :
1
Lastpage :
3
Abstract :
Provides a listing of current committee members and society officers.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2015 IEEE 33rd
Type :
conf
DOI :
10.1109/VTS.2015.7116243
Filename :
7116243
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3591070
