DocumentCode :
3591987
Title :
A Reflectometry Approach for Rippling Defect Measurement on High Glossy Surface
Author :
Jehhoon Bhang ; Youngjun Roh ; Daehwa Jeong
Author_Institution :
Production Eng. Res. Inst., LG Electron., Pyeongtaek, South Korea
fYear :
2014
Firstpage :
47
Lastpage :
49
Abstract :
Locally deformed defects, rippling, on home appliances cause appearance quality issues, and they look enlarged on high glossy surface. The defects need to be detected in the production line, where the product is moving on a conveyor transfer system. Inspection is executed by an expert but it is very subjective and not quantitative so that even quality assurance team cannot manage the defects levels. As a solution, a visual measurement methodology based on one shot reflection Moire is developed to obtain numerical data about surface defects. The system is introduced in this article, and experiment results are shown.
Keywords :
inspection; light reflection; quality control; reflectometry; conveyor transfer system; high glossy surface; home appliances; inspection; locally deformed defects; one shot reflection Moire; production line; quality assurance team; reflectometry; rippling defect measurement; surface defects; visual measurement; Cameras; Distortion measurement; Indexes; Inspection; Light sources; Mathematical model; Reflection; Vision waviness; phase pattern; reflection moiré; reflectometry; vision inspection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optomechatronic Technologies (ISOT), 2014 International Symposium on
Type :
conf
DOI :
10.1109/ISOT.2014.20
Filename :
7119383
Link To Document :
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