• DocumentCode
    3591987
  • Title

    A Reflectometry Approach for Rippling Defect Measurement on High Glossy Surface

  • Author

    Jehhoon Bhang ; Youngjun Roh ; Daehwa Jeong

  • Author_Institution
    Production Eng. Res. Inst., LG Electron., Pyeongtaek, South Korea
  • fYear
    2014
  • Firstpage
    47
  • Lastpage
    49
  • Abstract
    Locally deformed defects, rippling, on home appliances cause appearance quality issues, and they look enlarged on high glossy surface. The defects need to be detected in the production line, where the product is moving on a conveyor transfer system. Inspection is executed by an expert but it is very subjective and not quantitative so that even quality assurance team cannot manage the defects levels. As a solution, a visual measurement methodology based on one shot reflection Moire is developed to obtain numerical data about surface defects. The system is introduced in this article, and experiment results are shown.
  • Keywords
    inspection; light reflection; quality control; reflectometry; conveyor transfer system; high glossy surface; home appliances; inspection; locally deformed defects; one shot reflection Moire; production line; quality assurance team; reflectometry; rippling defect measurement; surface defects; visual measurement; Cameras; Distortion measurement; Indexes; Inspection; Light sources; Mathematical model; Reflection; Vision waviness; phase pattern; reflection moiré; reflectometry; vision inspection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optomechatronic Technologies (ISOT), 2014 International Symposium on
  • Type

    conf

  • DOI
    10.1109/ISOT.2014.20
  • Filename
    7119383