DocumentCode :
3592055
Title :
An Investigation on the Effect of Curvatures and Corners along Path
Author :
Yunpeng Feng ; Haobo Cheng ; Hon-Yuen Tam
Author_Institution :
Sch. of Optoelectron., Beijing Inst. of Technol., Beijing, China
fYear :
2014
Firstpage :
295
Lastpage :
304
Abstract :
The unit removal function (URF) of special tools and tool paths are required for the modern sub-aperture deterministic polishing technologies. Paths may affect the amount of removed material because of the curvatures and corners existing on them. This study proposes a mathematic model along path for analyzing the effects of curvatures and corners on material removal during polishing. A numerical method was used to calculate the integration of segments covered by the URF. The length covered by the URF was also determined to predict the amount of material removed from a given location of a path. For the effects of curvatures, the maximum material removed is a distance of about 0.5 to the normalized radius of the URF. For the effects of corners, the peak removal is a distance between 0.5 and 1 to a corner. The Harris corner detection algorithm was used to estimate corner distribution. Aside from curvatures and corners, the space between adjacent paths is another key parameter that affects the amount of removed material. The combined effect of curvatures, corners, and spaces was comprehensively analyzed, and two typical paths -- spiral and raster paths -- were introduced in polishing experiments. The experimental results are consistent with the numerical prediction.
Keywords :
optical fabrication; polishing; surface structure; Harris corner detection; adjacent paths; corner distribution; corner effect; curvature effect; material removal; mathematic model; modern subaperture deterministic polishing technology; normalized radius; peak removal; segment integration; tool paths; unit removal function; Adaptive optics; Convolution; Mathematical model; Numerical models; Optical crosstalk; Optical device fabrication; Surface treatment; Corner detection; Corner effect; Curvature effect; Tool path;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optomechatronic Technologies (ISOT), 2014 International Symposium on
Type :
conf
DOI :
10.1109/ISOT.2014.79
Filename :
7119443
Link To Document :
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