DocumentCode
359236
Title
Time interval measurement with application to electronic/optoelectronic circuits and systems
Author
Rogina, Branka Medved
Author_Institution
Dept. of Electron., Rudjer Boskovic Inst., Zagreb, Croatia
Volume
2
fYear
2000
fDate
2000
Firstpage
738
Abstract
In this paper measurement techniques which can be used for measurement of the nanosecond time intervals in various applications are discussed. We present our time interval measurement set up based on the start-step principle using a time-to-amplitude converter. The results of evaluating the timing characteristics in some electronic and optoelectronic circuits and systems, with picosecond resolution and statistical analysis of the experimental data, are reported.
Keywords
characteristics measurement; convertors; statistical analysis; time measurement; timing jitter; electronic/optoelectronic circuits; measurement techniques; nanosecond time intervals; picosecond resolution; start-step principle; statistical analysis; time interval measurement; time-to-amplitude converter; timing characteristics; Area measurement; Circuits and systems; Clocks; Linearity; Nuclear measurements; Pulse measurements; Semiconductor device measurement; Time measurement; Timing jitter; Velocity measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrotechnical Conference, 2000. MELECON 2000. 10th Mediterranean
Print_ISBN
0-7803-6290-X
Type
conf
DOI
10.1109/MELCON.2000.880039
Filename
880039
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