• DocumentCode
    3592706
  • Title

    Direct measurement of transverse mode correlation and MPN using 900nm VCSELs

  • Author

    Lavrencik, Justin ; Pavan, Sriharsha Kota ; Haupt, David K. ; Ralph, Stephen E.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Cross-correlations between VCSEL transverse modes are measured using 40GSps synchronous observations of spatially separated modes. Positive correlation and anti-correlation behaviors are observed as well as low, distinct kmpn, contrary to assumptions of the IEEE model.
  • Keywords
    laser cavity resonators; laser modes; laser noise; laser variables measurement; surface emitting lasers; IEEE model; VCSEL transverse modes; anti-correlation behaviors; cross-correlations; direct measurement; mode partition noise; positive correlation; spatially separated modes; synchronous observations; transverse mode correlation; wavelength 900 nm; Computers; Optical fibers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical Fiber Communications Conference and Exhibition (OFC), 2015
  • Type

    conf

  • Filename
    7122000
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3592706