Title :
Influence of shallow impurity on steady-state probability function of multilevel deep impurity
Author :
Puksec, Julijana Divkovic ; Gradisnik, Vera
Author_Institution :
Fac. of Electr. Eng., Zagreb Univ., Croatia
Abstract :
The deep impurity added into the n- or p-type semiconductor is partially ionised. The probability function used to describe the occupation of a deep energy level, is the Fermi-Dirac function into which the entropy factor is introduced; χp for donor level or ξn for acceptor level. The entropy factors are used to adjust the calculated and measured values. An effective deep energy level was defined depending on the predicted position of a deep level and on obtained entropy factor. Comparing the calculated and measured values for gold and platinum added into the n- and p-type silicon, we can see that the same predicted energy level is described with a quite different entropy factor in the n- and p-type semiconductor. According to the obtained positions of the effective deep energy levels, it can be concluded that in the compensation between shallow and deep impurity a deep level, which is nearest to the shallow level, must be considered. The other levels are neutral. It might happen that in the n-type semiconductor the higher acceptor level of platinum is occupied, while the lower one is empty. It seems that such a neutral energy level does not exist in the n-type, while in the p-type it does, and it is partially occupied
Keywords :
deep levels; elemental semiconductors; entropy; gold; impurity states; platinum; probability; quantum statistical mechanics; semiconductors; silicon; Fermi-Dirac function; Si:Au; Si:Pt; acceptor level; compensation; donor level; effective deep energy level; entropy factor; entropy factors; multilevel deep impurity; n-type; p-type; semiconductor; shallow impurity; steady-state probability function; Charge carrier processes; Energy states; Entropy; Gold; Neodymium; Photonic band gap; Platinum; Semiconductor impurities; Silicon; Steady-state;
Conference_Titel :
Electrotechnical Conference, 2000. MELECON 2000. 10th Mediterranean
Conference_Location :
Lemesos
Print_ISBN :
0-7803-6290-X
DOI :
10.1109/MELCON.2000.880398