Prediction of Electrostatic Discharge (ESD) soft error on two-way radio using ESD simulation in CST and ESD immunity scanning technique

Electrostatic Discharge (ESD) can cause ESD soft error failures such as radio reset. In this paper, a new methodology is developed to assess ESD risk at system level prior to PCB fabrication using 3D simulation. A Poynting vector theorem is used to calculate the accumulated incident power received by the sensitive IC which is identified through ESD immunity scanning test. The time-weighted-average peak power is to establish the criteria for ESD risk causing the soft error failure. Results from this paper will help electrical engineer to predict potential ESD reset failure at system level instead of the previously trial-and-error procedure.