Title :
New die attach adhesives enable low-stress MEMS packaging
Author_Institution :
DELO Ind. Adhesives, Windach, Germany
Abstract :
High flexibility is one of the key requirements on die attach materials for most MEMS packages as temperature changes during the assembly process and application lead to thermo-mechanical stress as a consequence of thermal mismatch, i.e. dissimilar coefficients of thermal expansion of substrate, chip and adhesive. A distortion of the signal characteristics of the extremely stress-sensitive MEMS device may be the consequence of this thermo-mechanical stress. For the first time, newly developed adhesives provide an outstanding combination of high flexibility and high die shear strength, giving them a competitive edge over the currently used MEMS die attach adhesives. This paper describes highly flexible heat-curing adhesives on the basis of acrylates and a patented mCD chemistry with Young´s modulus values down to 5 MPa (0.725 ksi) at room temperature. DMTA measurements show that temperature storage at +120 °C (+248 °F) does not cause adhesive embrittlement that could negatively affect the reliability of the MEMS package. The curing temperatures of these adhesives are extremely low down to +100 °C (+212 °F), which reduces stress development during the assembly process. In addition, the adhesives have very process-friendly properties and allow processing times of one week. The option of dual curing enables preliminary light fixation of the chip within just seconds.
Keywords :
Young´s modulus; adhesives; microassembling; micromechanical devices; semiconductor device packaging; semiconductor device reliability; shear strength; thermal analysis; thermomechanical treatment; DMTA measurements; Young´s modulus; adhesive embrittlement; assembly process; chip thermal expansion; die attach adhesive materials; dissimilar coefficients; dual curing; flexible heat-curing adhesives; low-stress MEMS packaging; mCD chemistry; micromechanical devices; preliminary light fixation; reliability; room temperature storage; shear strength; signal characteristic distortion; stress development reduction; stress-sensitive MEMS device; substrate thermal expansion; thermal mismatch; thermomechanical stress; Chemistry; Curing; Microassembly; Micromechanical devices; Stress; Temperature; Temperature measurement;
Conference_Titel :
Electronics Manufacturing Technology Conference (IEMT), 2014 IEEE 36th International
DOI :
10.1109/IEMT.2014.7123134