Title :
Leakage currents and capacitances of thick CZT detectors
Author :
Garson, Alfred, III ; Li, Qiang ; Jung, Ira V. ; Dowkontt, Paul ; Bose, Richard ; Simburger, Garry ; Krawczynski, Henric
Author_Institution :
Washington Univ. in St. Louis, St. Louis
Abstract :
The quality of cadmium zinc telluride (CZT) detectors is steadily improving. For state of the art detectors, readout noise is thus becoming an increasingly important factor for the overall energy resolution. In this contribution, we present measurements and calculations of the dark currents and capacitances of 0.5 cm thick CZT detectors contacted with a monolithic cathode and 8times8 anode pixels on a surface of 2times2 cm2. Using the NCI ASIC from Brookhaven National lab as an example, we estimate the readout noise caused by the dark currents and capacitances. Furthermore, we discuss possible additional readout noise caused by pixel-pixel and pixel-cathode noise cross- coupling.
Keywords :
capacitance measurement; dark conductivity; electric current measurement; leakage currents; semiconductor counters; Brookhaven National lab; CZT detectors; NCI ASIC; anode pixels; cadmium zinc telluride detectors; capacitance measurement; dark current measurement; energy resolution; leakage currents; monolithic cathode; pixel-cathode noise cross-coupling; pixel-pixel noise cross-coupling; readout noise; Cadmium compounds; Capacitance measurement; Current measurement; Dark current; Detectors; Energy resolution; Leak detection; Leakage current; Thickness measurement; Zinc compounds; CZT; electronic noise; radiation detection;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2007. NSS '07. IEEE
Print_ISBN :
978-1-4244-0922-8
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2007.4436597