DocumentCode
359393
Title
Analysis of upsets and failures due to ESD by the FDTD-INBCs method
Author
Maradei, F. ; Raugi, M.
Author_Institution
Dipartimento di Ingegneria Elettronica, Rome Univ., Italy
Volume
1
fYear
2000
fDate
2000
Firstpage
623
Abstract
In this paper a finite-difference time domain (FDTD) model of an electrostatic discharge (ESD) event is developed. Analytical expressions for the field radiated during the ESD discharge phase have been determined to test the FDTD model of the strike arc. In order to take into account the electromagnetic field penetration through shielding structures, the conductive panels are efficiently modeled in the FDTD by the impedance network boundary conditions (INBCs). The FDTD-INBCs method permits avoidance of the huge amount of cells needed to model accurately the penetration in the traditional FDTD algorithm based on the utilization of the regular Yee grid. The method is applied to carry out the analysis of ESD events in some configurations
Keywords
arcs (electric); electric impedance; electrostatic discharge; finite difference time-domain analysis; shielding; ESD; FDTD; Yee grid; conductive panels; electromagnetic field penetration; electrostatic discharge; finite-difference time domain; impedance network boundary conditions; shielding structures; strike arc; Boundary conditions; Electromagnetic fields; Electromagnetic modeling; Electrostatic discharge; Failure analysis; Finite difference methods; Impedance; Testing; Time domain analysis; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 2000. Conference Record of the 2000 IEEE
Conference_Location
Rome
ISSN
0197-2618
Print_ISBN
0-7803-6401-5
Type
conf
DOI
10.1109/IAS.2000.881176
Filename
881176
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