DocumentCode :
3594042
Title :
Large batch etching of sapphire wafers to achieve high throughput and low cost of ownership
Author :
Baclet, Stephanie ; Loveday, Mathew ; Newton, Andrew ; Dineen, Mark
Author_Institution :
Oxford Instrum. Plasma Technol., Bristol, UK
fYear :
2014
Firstpage :
23
Lastpage :
27
Abstract :
Formation of cone shaped sapphire features has been studied using the newly developed plasma etcher PlasmaPro 1000 Astrea from Oxford Instruments Plasma Technology. This new etcher uses a large Transformer Coupled Plasma (TCP) source which generates a high ion density. Patterned sapphire etching rate up to 120nm/min could be obtained using a BCl3 based chemistry. Control of the process settings has allowed demonstrating cone shape features with height up to 2um, smooth sidewalls and no trenching. Uniform etching within wafer and across batches of 48 × 2" and 14 × 4" substrates has been achieved with etch rates >60nm/min and selectivity >0.7:1.
Keywords :
boron compounds; ion density; plasma sources; sapphire; sputter etching; BCl3; Oxford Instruments Plasma Technology; TCP source; batch etching; chemistry; cone shaped sapphire features; high ion density; patterned sapphire etching rate; plasma etcher PlasmaPro 1000 Astrea; process settings; transformer coupled plasma source; Etching; Gallium nitride; Plasmas; Radio frequency; Resists; Shape; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Lighting (SSLCHINA), 2014 11th China International Forum on
Print_ISBN :
978-1-4799-6696-7
Type :
conf
DOI :
10.1109/SSLCHINA.2014.7127212
Filename :
7127212
Link To Document :
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