• DocumentCode
    3594042
  • Title

    Large batch etching of sapphire wafers to achieve high throughput and low cost of ownership

  • Author

    Baclet, Stephanie ; Loveday, Mathew ; Newton, Andrew ; Dineen, Mark

  • Author_Institution
    Oxford Instrum. Plasma Technol., Bristol, UK
  • fYear
    2014
  • Firstpage
    23
  • Lastpage
    27
  • Abstract
    Formation of cone shaped sapphire features has been studied using the newly developed plasma etcher PlasmaPro 1000 Astrea from Oxford Instruments Plasma Technology. This new etcher uses a large Transformer Coupled Plasma (TCP) source which generates a high ion density. Patterned sapphire etching rate up to 120nm/min could be obtained using a BCl3 based chemistry. Control of the process settings has allowed demonstrating cone shape features with height up to 2um, smooth sidewalls and no trenching. Uniform etching within wafer and across batches of 48 × 2" and 14 × 4" substrates has been achieved with etch rates >60nm/min and selectivity >0.7:1.
  • Keywords
    boron compounds; ion density; plasma sources; sapphire; sputter etching; BCl3; Oxford Instruments Plasma Technology; TCP source; batch etching; chemistry; cone shaped sapphire features; high ion density; patterned sapphire etching rate; plasma etcher PlasmaPro 1000 Astrea; process settings; transformer coupled plasma source; Etching; Gallium nitride; Plasmas; Radio frequency; Resists; Shape; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Lighting (SSLCHINA), 2014 11th China International Forum on
  • Print_ISBN
    978-1-4799-6696-7
  • Type

    conf

  • DOI
    10.1109/SSLCHINA.2014.7127212
  • Filename
    7127212