• DocumentCode
    3594059
  • Title

    Internal quantum efficiency droop of GaN LED

  • Author

    Yi Ting He ; Min Gong ; Zhi Ren Qiu ; Zhe Chuan Feng

  • Author_Institution
    State Key Lab. of Optoelectron. Mater. & Technol., Sun Yat-Sen Univ., Guangzhou, China
  • fYear
    2014
  • Firstpage
    79
  • Lastpage
    83
  • Abstract
    Begin with the carrier equation, the relationship between the carrier generation rate G and the integrated photoluminescence intensity IPL can be obtained. And the internal quantum efficiency (IQE) of InGaN/GaN MQWs can be determined from the dependence of integrated PL intensity on excitation power. The photoluminescence of a LED sample with Charge Asymmetric Resonance Tunneling (CART) structure were studied. The experimental data shows that the peak from InGaN quantum well shifts blue and its integrated intensity increases slowly when the exciting power increases. And the IQE of this LED chip decreases as the exciting power increasing.
  • Keywords
    III-V semiconductors; gallium compounds; indium compounds; integrated optoelectronics; light emitting diodes; photoluminescence; semiconductor quantum wells; spectral line shift; tunnelling; wide band gap semiconductors; CART; GaN LED; InGaN-GaN; MQW; blue shift; carrier equation; carrier generation rate; charge asymmetric resonance tunneling; excitation power; integrated PL intensity; integrated photoluminescence intensity; internal quantum efficiency droop; light emitting diodes; multiple quantum well; Gallium nitride; Light emitting diodes; Photoluminescence; Physics; Quantum well devices; Radiative recombination;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Lighting (SSLCHINA), 2014 11th China International Forum on
  • Print_ISBN
    978-1-4799-6696-7
  • Type

    conf

  • DOI
    10.1109/SSLCHINA.2014.7127226
  • Filename
    7127226