• DocumentCode
    3594354
  • Title

    The growth of modern interferometry for industrial inspection

  • Author

    Burton, D.R. ; Lalor, M.J. ; Atkinson, J.T.

  • Author_Institution
    Liverpool Polytech., UK
  • fYear
    1991
  • fDate
    2/19/1991 12:00:00 AM
  • Firstpage
    42430
  • Lastpage
    42433
  • Abstract
    Two major developments in interferometry are discussed. One is the availability of cheap reliable He-Ne lasers, which have replaced expensive, unreliable and unwieldy sources with a device with is compact and cheap. The most recent product, coherent laser diodes, give extremely robust and reliable sources in a very small semiconductor package. The other development is the growth of computer technology, which has made high speed digital image processing available at low cost to most workers in the field. The analysis of interferograms is an algorithmic issue
  • Keywords
    automatic optical inspection; computerised instrumentation; computerised picture processing; gas lasers; light interferometry; He-Ne lasers; coherent laser diodes; computer technology; high speed digital image processing; industrial inspection; interferometry; semiconductor package;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Active and Passive Techniques for 3-D Vision, IEE Colloquium on
  • Type

    conf

  • Filename
    181134