DocumentCode :
3594850
Title :
Analysis of the transverse energy distribution of HopFED
Author :
Xiaobing Zhang ; Wei Lei ; Min Liu ; Laibin Zhang ; den Engelsen, Daniel ; Xuedong Zhou ; Qilong Wang Jin Dong Fei
Author_Institution :
Display Technol. R & D Center, Southeast Univ., Nanjing, China
fYear :
2004
Firstpage :
163
Lastpage :
164
Abstract :
For HopFED applications without a flu spacer the normal energy distribution is less important than the energy distribution in the direction perpendicular to the propagation of the beam, the transverse energy Et. The transverse energy distribution of electrons leaving the exit hole of a hop spacer plate in a HopFED was measured experimentally and analyzed. These electrons were accelerated in a uniform field onto the anode screen. The luminance distribution of the spot on the screen was in our experimental set up largely determined by the transverse energy distribution of the electron beam. A directly grown carbon nanotube (CNT) field emitters as electron source was used. The system was positioned in a vacuum chamber with a glass window for viewing and measuring the electron spot. A digital camera recorded the luminance distribution of the electron spot on the phosphor screen. Software, which was originally developed for CRT spot size measurement, had to be improved for our luminance analysis. The analyses of the luminance distribution show that the transverse energy is rather low and that a HOPFED without a flu spacer will have good beam directionality.
Keywords :
brightness; carbon nanotubes; electron accelerators; electron beams; electron emission; field emission displays; CRT spot size measurement; HopFED; beam directionality; beam propagation; carbon nanotube field emitters; digital camera; electron beam; electron source; luminance analysis; luminance distribution; transverse energy distribution; vacuum chamber; Acceleration; Anodes; Carbon nanotubes; Charge carrier processes; Electron beams; Electron sources; Energy measurement; Glass; Influenza; Vacuum systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electron Sources Conference, 2004. Proceedings. IVESC 2004. The 5th International
Print_ISBN :
0-7803-8437-7
Type :
conf
DOI :
10.1109/IVESC.2004.1414175
Filename :
1414175
Link To Document :
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