DocumentCode
3594943
Title
Reject option for VQ-based Bayesian classification
Author
Vailaya, Aditya ; Jain, Anil
Author_Institution
Dept. of Comput. Sci. & Eng., Michigan State Univ., East Lansing, MI, USA
Volume
2
fYear
2000
fDate
6/22/1905 12:00:00 AM
Firstpage
48
Abstract
We have developed a reject option for VQ-based supervised Bayesian classification to improve classification accuracy by sieving out patterns that are classified with a low confidence value. A small codebook extracted from a learning vector quantizer (LVQ) is used to estimate the class-conditional densities of the feature vector. We adapt the two commonly used rejection criteria, outlier rejection and ambiguity rejection, for the VQ-based Bayesian classifiers. Using three high-level image classification problems, we demonstrate how local rejection criteria can improve the error vs. reject characteristics of our classifier over a global rejection method
Keywords
Bayes methods; image classification; learning (artificial intelligence); vector quantisation; ambiguity rejection; class-conditional densities; classification accuracy; high-level image classification problems; learning vector quantizer; local rejection criteria; low confidence value; outlier rejection; reject option; small codebook; vector quantization-based supervised Bayesian classification; Bayesian methods; Image classification; Industrial control; Medical diagnosis; Medical robotics; Prototypes; Service robots; Speech recognition; Testing; Vector quantization;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 2000. Proceedings. 15th International Conference on
ISSN
1051-4651
Print_ISBN
0-7695-0750-6
Type
conf
DOI
10.1109/ICPR.2000.906016
Filename
906016
Link To Document