• DocumentCode
    3594943
  • Title

    Reject option for VQ-based Bayesian classification

  • Author

    Vailaya, Aditya ; Jain, Anil

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Michigan State Univ., East Lansing, MI, USA
  • Volume
    2
  • fYear
    2000
  • fDate
    6/22/1905 12:00:00 AM
  • Firstpage
    48
  • Abstract
    We have developed a reject option for VQ-based supervised Bayesian classification to improve classification accuracy by sieving out patterns that are classified with a low confidence value. A small codebook extracted from a learning vector quantizer (LVQ) is used to estimate the class-conditional densities of the feature vector. We adapt the two commonly used rejection criteria, outlier rejection and ambiguity rejection, for the VQ-based Bayesian classifiers. Using three high-level image classification problems, we demonstrate how local rejection criteria can improve the error vs. reject characteristics of our classifier over a global rejection method
  • Keywords
    Bayes methods; image classification; learning (artificial intelligence); vector quantisation; ambiguity rejection; class-conditional densities; classification accuracy; high-level image classification problems; learning vector quantizer; local rejection criteria; low confidence value; outlier rejection; reject option; small codebook; vector quantization-based supervised Bayesian classification; Bayesian methods; Image classification; Industrial control; Medical diagnosis; Medical robotics; Prototypes; Service robots; Speech recognition; Testing; Vector quantization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2000. Proceedings. 15th International Conference on
  • ISSN
    1051-4651
  • Print_ISBN
    0-7695-0750-6
  • Type

    conf

  • DOI
    10.1109/ICPR.2000.906016
  • Filename
    906016