DocumentCode :
3594944
Title :
A critical review of the growth and properties of a-(Si,Ge):H
Author :
Dalal, Vikram L. ; Kaushal, Sanjeev ; Xu, Jun ; Han, Kay
Author_Institution :
Dept. of Electr. Eng., Iowa State Univ., Ames, IA, USA
Volume :
1
fYear :
1994
Firstpage :
464
Abstract :
The authors review the status of a-(Si,Ge):H technology for tandem solar cell applications. In particular, they show that the chemistry of growth and deposition conditions play a major role in determining the properties of a-(Si,Ge):H. They explain why dilution is necessary to make good films, and show that ion bombardment plays a major role in improving the properties of the material. Recent work on films deposited using ion bombardment in a controlled ECR reactor environment is discussed, and it is shown that fundamental material properties such as Urbach energies and mid-gap defects can be improved using controlled bombardment. It is also shown that high ion bombardment in glow-discharge deposited devices improves the fundamental material properties. They also discuss the unknown parameters in the a-(Si,Ge):H system, and suggest some research avenues that should be pursued
Keywords :
Ge-Si alloys; amorphous semiconductors; hydrogen; p-n heterojunctions; plasma deposited coatings; plasma deposition; semiconductor doping; semiconductor growth; semiconductor thin films; solar cells; ECR reactor environment; SiGe:H; Urbach energies; a-(Si,Ge):H tandem solar cells; amorphous semiconductor; controlled bombardment; deposition conditions; dilution; glow discharge deposition; growth chemistry; ion bombardment; material properties; mid-gap defects; Amorphous silicon; Chemical technology; Fractionation; Inductors; Material properties; Microelectronics; Plasma chemistry; Plasma devices; Plasma materials processing; Polymer films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Energy Conversion, 1994., Conference Record of the Twenty Fourth. IEEE Photovoltaic Specialists Conference - 1994, 1994 IEEE First World Conference on
Print_ISBN :
0-7803-1460-3
Type :
conf
DOI :
10.1109/WCPEC.1994.519998
Filename :
519998
Link To Document :
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