DocumentCode :
3595006
Title :
Limitations on the damage mechanism in dry band arcing on all dielectric self supporting cables
Author :
Brewer, D.A. ; Dissado, L.A. ; Parry, M.J.
Author_Institution :
Pirelli Communication Cables Div., Newport, UK
fYear :
1992
Firstpage :
49
Lastpage :
52
Abstract :
A laboratory test has been developed that reproduces the dry band arcing failure mechanism seen under service conditions. The limitations of the test method have been investigated, and a range of test parameters defined within which dry band arcing is the failure mechanism. Comparison with a field trial has shown the similarities between the two, but by using an unrestricted current in the laboratory test, the dry down period is substantially reduced and arcing occurs after every wet/dry cycle. Additionally, the short duration, high current arcs produced add an additional damage mechanism that ensures the laboratory test is considerably more severe than a real installation
Keywords :
arcs (electric); cable testing; failure analysis; optical cables; power overhead lines; all dielectric self supporting cables; damage mechanism; dry band arcing; dry down period; failure mechanism; field trial; high current arcs; laboratory test; optical cables; wet/dry cycle;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Dielectric Materials, Measurements and Applications, 1992., Sixth International Conference on
Print_ISBN :
0-85296-551-6
Type :
conf
Filename :
186878
Link To Document :
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