• DocumentCode
    3595264
  • Title

    A solid state detector for intraoperative imaging

  • Author

    Visvikis, D. ; MacDonald, J.H.

  • Author_Institution
    Wolfson Brain Imaging Centre, Cambridge Univ., UK
  • Volume
    2
  • fYear
    1998
  • fDate
    6/20/1905 12:00:00 AM
  • Firstpage
    1295
  • Abstract
    A beta detecting probe for intraoperative tumour imaging and localisation has been developed. The probe is based on a charge coupled device which detects the particles directly in its sensitive volume. The active area of the device is encapsulated within a carbon-fibre loaded plastic housing of 75 μm in thickness. Images are displayed in real time on a computer screen with a readout frequency of 1 MHz. A study of the effect of dark current on image formation at body temperature has demonstrated a reduction in the signal of ~55%. The advantage of this device for intraoperative tumour imaging is its minimal sensitivity to the background gamma radiation. This was confirmed using a 18F source separated by the CCD with a 2 cm perspex block to absorb the positrons. The linearity of the probe was also tested over an activity range of 1-100 μCi. Although the intrinsic resolution of the CCD was measured to be equal to 66 μm, the image resolution of the device was <200 μm. The sensitivity of the CCD at body temperature was 1120 counts/sec/μCi
  • Keywords
    CCD image sensors; biomedical equipment; electron probes; radioisotope imaging; surgery; tumours; 1 MHz; 1E-6 to 1E-4 ci; 2 cm; 200 mum; 66 mum; F; beta detecting probe; body temperature; dark current; image formation; intraoperative imaging; intrinsic resolution; medical instrumentation; probe linearity; real time image display; solid state detector; tumour imaging; tumour localisation; Charge coupled devices; Charge-coupled image sensors; Computer displays; Detectors; Image resolution; Plastics; Probes; Solid state circuits; Temperature sensors; Tumors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-5021-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1998.774393
  • Filename
    774393