Multilayer material analysis using an active millimeter wave imaging system

Author

Klenner, Mathias ; Zech, Christian ; Hulsmann, A. ; Tessmann, A. ; Leuther, A. ; Schlechtweg, Michael ; Wagner, Jens ; Ambacher, Oliver

Author_Institution

Fraunhofer Inst. for Appl. Solid State Phys. (IAF), Freiburg im Breisgau, Germany

Volume

1

fYear

2013

Firstpage

207

Lastpage

213

Abstract

In this paper we demonstrate an active millimeter wave imaging system which is able to analyze the multilayer structure of dielectric materials with respect to defects such as voids or delamination. The system is based on an ultra wide band FMCW radar with two frequency multipliers from 8 GHz to 96 GHz and an I/Q heterodyne receiver operating at W-band. These circuits have been fabricated in-house using our 100 nm InGaAs mHEMT process [1].

Keywords

CW radar; FM radar; dielectric materials; frequency multipliers; gallium arsenide; high electron mobility transistors; indium compounds; millimetre wave devices; millimetre wave imaging; ultra wideband radar; I-Q heterodyne receiver; InGaAs; W-band; active millimeter wave imaging system; delamination; dielectric materials; frequency 8 GHz to 96 GHz; frequency multipliers; mHEMT process; multilayer material analysis; multilayer structure; size 100 nm; ultra wide band FMCW radar; voids; Dielectric materials; Imaging; Millimeter wave radar; Nonhomogeneous media; Radio frequency; Receivers;

fLanguage

English

Publisher

ieee

Conference_Titel

Radar Symposium (IRS), 2013 14th International

Print_ISBN

978-1-4673-4821-8

Type

conf

Filename

6581088