DocumentCode :
3595837
Title :
Towards An Ultra-Low-Power Architecture Using Single-Electron Tunneling Transistors
Author :
Zhu, Changyun ; Gu, Zhenyu ; Shang, Li ; Dick, Robert P. ; Knobel, Robert G.
Author_Institution :
Queen´´s Univ. Kingston, Kingston
fYear :
2007
Firstpage :
312
Lastpage :
317
Abstract :
Minimizing power consumption is vitally important in embedded system design; power consumption determines battery lifespan. Ultra- low-power designs may even permit embedded systems to operate without batteries, e.g., by scavenging energy from the environment. Moreover, managing power dissipation is now a key factor in integrated circuit packaging and cooling. As a result, embedded system price, size, weight, and reliability are all strongly dependent on power dissipation. Recent developments in nanoscale devices open new alternatives for low-power embedded system design. Among these, single-electron tunneling transistors (SETs) hold the promise of achieving the lowest power consumption. However, SETs impose unique design constraints that strongly influence architectural and circuit-level decisions. Unfortunately, most analysis of SETs has focused on single devices instead of architectures, making it difficult to determine whether they are appropriate for low-power embedded systems. This article presents possible uses of SETs in high-performance and battery-powered embedded system design. The resulting fault-tolerant, hybrid SET/CMOS, reconfigurable architecture can be tailored to specific requirements and allows trade-offs among power consumption, performance, operation temperature, fabrication cost, and reliability. This work is a first step in evaluating the system-level potential of reducing power consumption by using SETs.
Keywords :
CMOS integrated circuits; embedded systems; fault tolerance; integrated circuit design; low-power electronics; nanoelectronics; semiconductor device models; single electron transistors; battery-powered embedded system design; embedded system design; hybrid SET/CMOS; integrated circuit packaging; power dissipation; reconfigurable architecture; single-electron tunneling transistor; ultra-low-power architecture; Batteries; Embedded system; Energy consumption; Energy management; Integrated circuit packaging; Power dissipation; Power system management; Power system reliability; Single electron transistors; Tunneling; Design; Single electron tunneling transistor (SET); low-power; nanoelectronics; performance; reconfigurable architecture; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
ISSN :
0738-100X
Print_ISBN :
978-1-59593-627-1
Type :
conf
Filename :
4261197
Link To Document :
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