Title :
Interconnects in the Third Dimension: Design Challenges for 3D ICs
Author :
Bernstein, Kerry ; Andry, Paul ; Cann, Jerome ; Emma, Phil ; Greenberg, David ; Haensch, Wilfried ; Ignatowski, Mike ; Koester, Steve ; Magerlein, John ; Puri, Ruchir ; Young, Albert
Author_Institution :
IBM, Yorktown Heights
Abstract :
Despite generation upon generation of scaling, computer chips have until now remained essentially 2-dimensional. Improvements in on-chip wire delay and in the maximum number of I/O per chip have not been able to keep up with transistor performance growth; it has become steadily harder to hide the discrepancy. 3D chip technologies come in a number of flavors, but are expected to enable the extension of CMOS performance. Designing in three dimensions, however, forces the industry to look at formerly-two- dimensional integration issues quite differently, and requires the re-fitting of multiple existing EDA capabilities.
Keywords :
CMOS integrated circuits; integrated circuit design; integrated circuit interconnections; wafer-scale integration; 3D IC design; 3D chip; 3D interconnects; CMOS performance; computer chips; on-chip wire delay; wafer-scale integration; Assembly; Atherosclerosis; CMOS technology; Copper; Delay; Microelectronics; Packaging; Permission; Silicon on insulator technology; Through-silicon vias; 3D; Bandwidth; Chip-stack; Design; Hierarchical Memory; Interconnect; Latency; Performance; Silicon Carrier; Standardization; Theory; Through-wafer via;
Conference_Titel :
Design Automation Conference, 2007. DAC '07. 44th ACM/IEEE
Print_ISBN :
978-1-59593-627-1