DocumentCode :
3596050
Title :
Enhancement of effective electromechanical coupling factor by mass loading in layered SAW device structures
Author :
Gongbin Tang ; Tao Han ; Teshigahara, Akihiko ; Iwaki, Takao ; Hashimoto, Ken-ya
Author_Institution :
Sch. of Electron. Inf. & Electr. Eng., Shanghai Jiao Tong Univ., Shanghai, China
fYear :
2015
Firstpage :
416
Lastpage :
419
Abstract :
This paper describes drastic enhancement of Ke2 by mass loading in layered SAW device structures such as the ScAlN film/Si substrate. It is shown that this phenomenon is obvious even when an amorphous SiO2 film is deposited on the top surface for temperature compensation. This enhancement is caused by SAW energy confinement to the top surface of the ScAlN layer where the IDT is placed. This Ke2 enhancement is also found when other electrode and/or substrate materials are employed.
Keywords :
aluminium compounds; compensation; piezoelectricity; scandium compounds; surface acoustic wave devices; ScAlN-Si; Si; effective electromechanical coupling factor; electrode materials; layered SAW device structures; mass loading; substrate materials; temperature compensation; Electrodes; Films; Loading; Silicon; Substrates; Surface acoustic wave devices; Surface acoustic waves; ScAlN film; SiO2 overlay; effective electro-mechanical coupling factor; layered structure; mass loading;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium & the European Frequency and Time Forum (FCS), 2015 Joint Conference of the IEEE International
Print_ISBN :
978-1-4799-8865-5
Type :
conf
DOI :
10.1109/FCS.2015.7138870
Filename :
7138870
Link To Document :
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