DocumentCode :
3596765
Title :
Ultrawideband ultralow PDN impedance of decoupling capacitor embedded interposers using narrow gap chip parts mounting technology for 3-D integrated LSI system
Author :
Kikuchi, Katsuya ; Aoyagi, Masahiro ; Ujiie, Masaaki ; Takayama, Shinya
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
fYear :
2014
Firstpage :
1
Lastpage :
6
Abstract :
We have developed a new chip capacitor embedded interposer using a narrow gap chip parts mounting technology. This interposer is expected to reduce power distribution network (PDN) impedance. To investigate the efficacy of the interposer, we have fabricated other various types of capacitor embedded interposer test element group (TEG), such as a general chip capacitor embedded organic interposer, a thin film capacitor on a silicon interposer using the same design. We evaluated PDN impedances of decoupling capacitor embedded interposers for a 3-D integrated LSI system by using a developed ultralow impedance evaluation system. As a result, the chip capacitor embedded interposer using the narrow gap chip parts mounting technology shows a low PDN impedance below 0.1 Ω could be evaluated at the frequency range of up to 10 GHz. This indicates that the developed interposer shows a comparable level of the PDN impedance as the thin film capacitor embedded silicon interposer. It can be realized that the PDN impedance of the interposer shows below 1/100 compared with a general interposer with embedded the chip capacitor parts of 0603 types.
Keywords :
distribution networks; integrated circuit interconnections; integrated circuit measurement; integrated circuit testing; large scale integration; surface mount technology; thin film capacitors; three-dimensional integrated circuits; ultra wideband technology; 3D integrated LSI system; TEG; chip capacitor embedded interposer; mounting technology; narrow gap chip; organic interposer; power distribution network impedance; silicon interposer; test element group; thin film capacitor; ultrawideband ultralow PDN impedance; Capacitors; Frequency measurement; Impedance; Impedance measurement; Large scale integration; Semiconductor device measurement; Silicon; PDN impedance; decoupling capacitor embedded interposer; narrow gap chip parts mounting technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
3D Systems Integration Conference (3DIC), 2014 International
Type :
conf
DOI :
10.1109/3DIC.2014.7152157
Filename :
7152157
Link To Document :
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