DocumentCode :
3596781
Title :
On-chip checkpointing with 3D-stacked memories
Author :
Sato, Masayuki ; Egawa, Ryusuke ; Takizawa, Hiroyuki ; Kobayashi, Hiroaki
Author_Institution :
Cyberscience Center, Tohoku Univ., Sendai, Japan
fYear :
2014
Firstpage :
1
Lastpage :
6
Abstract :
Since deep-submicron process technologies induce soft errors, advanced computing systems face a low dependability problem. Checkpointing, which copies data required for continuing the program execution as a backup, is expected as a promising approach to keeping a high dependability. However, checkpointing causes additional memory accesses, which cause performance and energy overheads. To reduce these overheads, this paper focuses on 3D-stacking technologies. Since the technologies realize large on-chip memories with a short latency and a high bandwidth, the overheads of checkpointing are expected to decrease. In order to examine the reduction of the overheads, this paper supposes a future 3D-stacked processor-memory module, and proposes an on-chip checkpointing mechanism. The evaluation results indicate that the on-chip checkpointing with 3D-stacked memories can reduce the execution time by 15% and energy consumption by 26% on average, compared with the checkpointing mechanism with off-chip memories.
Keywords :
energy consumption; integrated circuit testing; integrated memory circuits; low-power electronics; microprocessor chips; three-dimensional integrated circuits; 3D-stacked processor-memory module; 3D-stacking technologies; computing systems; deep-submicron process technologies; energy consumption; energy overheads; on-chip checkpointing mechanism; program execution; soft errors; Checkpointing; Energy consumption; Error correction codes; Memory management; Random access memory; System-on-chip; Three-dimensional displays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
3D Systems Integration Conference (3DIC), 2014 International
Type :
conf
DOI :
10.1109/3DIC.2014.7152173
Filename :
7152173
Link To Document :
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