In situ investigation of pressure in a fully-sealed field emission display panel

The vacuum level inside a FED device significantly influences the performance of the field emitters. In order to investigate the pressure inside a fully-sealed FED, and in particular to monitor the pressure in situ during the aging process, an ion gauge was integrated to the device. The pressure inside the device was measured during the sealing process and after activation of getters. The pressure change during aging process was also recorded. The in-situ monitoring of the pressure provides a guide for optimizing the aging process.