DocumentCode :
3596997
Title :
Characterisation of industrial-scale remote PECVD SiN depositions
Author :
Winderbaum, Saul ; Leo, Anthony J. ; Shea, Stephen P. ; Koval, Timothy D. ; Kumar, Bikash
Author_Institution :
Shamash Australia Pty Ltd., Australia
Volume :
2
fYear :
2003
Firstpage :
1128
Abstract :
Remote PECVD SiN deposition parameters have been optimised for a fired-through metallization process on multicrystalline silicon solar cells. The best pressure, gas ratio and deposition temperature resulted in cell efficiencies of up to 14.3% when used with a 30 Ohm/square emitter and above 15% for 40 Ohm/square diffusion. Fourier transform infrared spectroscopy revealed that, during firing, the films lost a significant proportion of their hydrogen content, providing good bulk and surface passivation. In all cases the refractive index was reduced by approximately 1% during firing. The parameter space that gives optimal conditions for the lighter emitter coincides with a region in which the refractive index can be varied, resulting in greater process flexibility.
Keywords :
Fourier transform spectra; infrared spectra; metallisation; passivation; plasma CVD; refractive index; semiconductor growth; semiconductor thin films; silicon compounds; solar cells; wide band gap semiconductors; Fourier transform infrared spectroscopy; SiN; cell efficiencies; deposition temperature; gas ratio; hydrogen content; metallization process; multicrystalline silicon solar cells; parameter space; refractive index; remote PECVD SiN depositions; surface passivation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
Print_ISBN :
4-9901816-0-3
Type :
conf
Filename :
1306113
Link To Document :
بازگشت