• DocumentCode
    3597445
  • Title

    Influences of technological processing and surface finishes on thermal behaviour of thermal interface materials

  • Author

    Ras, M. Abo ; Wunderle, B. ; May, D. ; Oppermann, H. ; Schacht, R. ; Michel, B.

  • Author_Institution
    Berliner Nanotest & Design GmbH, Berlin, Germany
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The ongoing need for miniaturization and speed in electronics industry has brought a requirement for better performing thermal management systems. One of the major bottlenecks in thermal management is the thermal interface resistance. Characterisation of thermal interface materials become even tougher a challenge at low bond line thicknesses and higher thermal conductivities of the interface materials as more accurate measurement techniques are required. In this paper a platform for characterisation of interface materials is presented. Moreover the influence of curing regime on thermal properties of thermal adhesive is investigated. A clear influence of curing parameters was found. For thermal characterisation of sintered silver a test stand has been developed still using steady state techniques. We the results process parameters could be optimized. Part of the work has been accomplished within the running EU Project “Nanopack”.
  • Keywords
    curing; electronics industry; silver; surface finishing; thermal conductivity; thermal management (packaging); thermal resistance; Ag; curing parameter; electronics industry; miniaturization; sintered silver; steady state technique; surface finish; technological processing; thermal adhesive; thermal behaviour; thermal conductivity; thermal interface material; thermal interface resistance; thermal management system; thermal property; Conductivity; Curing; Materials; Temperature measurement; Temperature sensors; Thermal conductivity; Thermal force;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Investigations of ICs and Systems (THERMINIC), 2010 16th International Workshop on
  • Print_ISBN
    978-1-4244-8453-9
  • Type

    conf

  • Filename
    5636314