Title :
Performance analysis of variable bit rate multiclass services in a multi-time-hopping pulse position modulation UWB system
Author :
Wong, T.C. ; Mark, J.W. ; Chua, K.C.
Author_Institution :
Agency for Sci., Technol. & Res., Inst. for Infocomm Res., Singapore, Singapore
Abstract :
An analytical formulation of the outage probability in terms of bit error rate specification for variable bit rate (VBR) multiclass services in a multi-time-hopping (MTH) binary pulse position modulation (PPM) ultra-wideband (UWB) system is presented. The analytical framework is formulated for the general case in which different traffic classes have different varying bit rates. Multiple time hopping sequences are used by each user to achieve variable bit rate (VBR). Closed-form expressions for the signal at the correlator´s output during a frame interval and the power of the interference resulting from one of the active time hopping sequences from the interfering users on one pulse are explicitly derived. The analytical work leads to the determination of the capacity region of an MTH binary PPM UWB system with VBR traffic. Numerical results of the capacity region corresponding to typical parameter values are also presented.
Keywords :
ad hoc networks; bandwidth allocation; binary sequences; channel capacity; error statistics; pulse position modulation; quality of service; telecommunication traffic; ultra wideband communication; variable rate codes; VBR traffic; active time hopping sequences; binary PPM; bit error rate specification; capacity region; closed-form expressions; multi-time-hopping UWB system; multiple time hopping sequences; outage probability; performance analysis; pulse position modulation; traffic classes; ultra-wideband system; variable bit rate multiclass services; varying bit rates; Bit error rate; Bit rate; Closed-form solution; FCC; Performance analysis; Pulse modulation; Quality of service; Traffic control; Ultra wideband technology; Wireless communication;
Conference_Titel :
Wireless Communications and Networking Conference, 2005 IEEE
Print_ISBN :
0-7803-8966-2
DOI :
10.1109/WCNC.2005.1424577