DocumentCode :
3597529
Title :
Observable Degree Analysis of SINS Initial Alignment Based on Singular Value Decomposition
Author :
Rui, LONG ; Yong-yuan, QIN ; Ji-chao, JIA
Author_Institution :
Coll. of Autom., Northwestern Polytech. Univ., Xian
fYear :
2008
Firstpage :
444
Lastpage :
448
Abstract :
In this paper, observable degree of SINS based on singular value decomposition (SVD) is analyzed during initial alignment, and an improved method using the right singular vectors to calculate the observable degrees is proposed. Firstly, an error model is introduced for SINS on rocking base. Secondly, the model is demonstrated to satisfy the piece-wise constant system (PWCS) analysis law. Thus, the observability of system states can be simply analyzed by using the stripped observability matrix (SOM) as the substitute for the complex total observability matrix (TOM). Then the observable degrees of system states of SINS are analyzed based on the SVD of PWCS observability matrix, and the method to calculate the observable degrees is improved. Finally, computer simulation is carried out, and the results of simulation indicate that observable degree indexes are able to better predict Kalman filtering errors of system states. Therefore, the improved method discussed in this paper is effective.
Keywords :
observability; singular value decomposition; Kalman filtering errors; SINS initial alignment; error model; observable degree analysis; observable degree indexes; piece-wise constant system analysis law; singular value decomposition; singular vectors; strapdown inertial navigation system; stripped observability matrix; system state observability; total observability matrix; Computational modeling; Computer errors; Computer simulation; Filtering; Kalman filters; Matrices; Observability; Predictive models; Silicon compounds; Singular value decomposition; SINS; Singular value decomposition; observable degree; piece-wise constant system; right singular vector;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Knowledge Acquisition and Modeling Workshop, 2008. KAM Workshop 2008. IEEE International Symposium on
Print_ISBN :
978-1-4244-3530-2
Electronic_ISBN :
978-1-4244-3531-9
Type :
conf
DOI :
10.1109/KAMW.2008.4810520
Filename :
4810520
Link To Document :
بازگشت