DocumentCode :
3598239
Title :
Esophageal Electric Fields are Correlated to Atrial Defibrillation Thresholds: Towards Patient-Specific Optimization of External Atrial Defibrillation
Author :
Fitch, David A. ; Soberman, Judith E. ; de Jongh Curry, Amy
Author_Institution :
Biomed. Eng. Dept., Memphis Univ., TN
fYear :
2006
Firstpage :
4378
Lastpage :
4381
Abstract :
Studies have investigated the effect of defibrillator paddle position on the efficacy of external electrocardioversion of atrial fibrillation, without agreeing upon an optimal placement. We wish to investigate using esophageal electric fields (EEFs) to predict atrial defibrillation thresholds (ADFTs) on a patient-specific basis. We propose to (1) investigate the relationship between EEFs and ADFTs using computer simulations, (2) develop an esophageal probe that can accurately measure three-dimensional electric fields and (3) investigate the relationship between EEFs and ADFTs values in-vivo. Sixteen anterior-anterior and eleven anterior-posterior placements were simulated yielding a negative relationship between EEFs and ADFTs (R2=0.91 and 0.93, respectively). An esophageal probe was developed that accurately measures EEFs. Animal studies showed a negative relationship between EEFs and ADFTs. This data suggests using EEFs to predict ADFTs on a patient-specific basis is plausible
Keywords :
bioelectric phenomena; biomedical electrodes; defibrillators; medical computing; muscle; probes; atrial defibrillation thresholds; computer simulations; defibrillator paddle position; esophageal electric fields; esophageal probe; external atrial defibrillation; patient-specific electrode placement; patient-specific optimization; three-dimensional electric field measurement; Biomedical engineering; Biomedical measurements; Computer simulation; Defibrillation; Electric shock; Electric variables measurement; Esophagus; Fibrillation; Probes; Skin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
ISSN :
1557-170X
Print_ISBN :
1-4244-0032-5
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2006.259417
Filename :
4462772
Link To Document :
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