Title :
Discussion on fundamental issues of NPR measurements
Author :
Geens, Alain ; Rolain, Yves ; Vanhoenacker, Kenneth ; Schoukens, Johan
Author_Institution :
Dept. ELEC, Vrije Univ., Brussels, Belgium
Abstract :
This paper investigates the disagreement that exists between Noise Power Patio (NPR) measurements and a recently published statement that those measurements always underestimate the real nonlinear in-band distortions. A more fundamental approach to settle this discussion is presented First it is shown that nonlinear distortions can be split in different contributions, forming the fundamental parts of the NPR or in-band distortions. Next, measurement techniques are presented to obtain these different contributions.
Keywords :
electric noise measurement; microwave amplifiers; microwave measurement; nonlinear distortion; NPR measurements; microwave measurement; narrow band amplifier; noise power ratio measurements; real nonlinear in-band distortions; Band pass filters; Circuit noise; Distortion measurement; Linear systems; Noise generators; Noise measurement; Nonlinear distortion; Nonlinear systems; Power measurement; Signal to noise ratio;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2001. IMTC 2001. Proceedings of the 18th IEEE
Print_ISBN :
0-7803-6646-8
DOI :
10.1109/IMTC.2001.928805