• DocumentCode
    35985
  • Title

    On the Effects of Mismatch on Quadrature Accuracy in Tapped-Capacitor Load Independent Quadrature LC-Oscillators

  • Author

    Sah, Suman P. ; Agarwal, Prabhakar ; Deukhyoun Heo

  • Author_Institution
    Washington State Univ., Pullman, WA, USA
  • Volume
    61
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    1409
  • Lastpage
    1415
  • Abstract
    This paper presents a study of quadrature phase error due to various systematic mismatches and loading effects on the oscillation frequency in a tapped-capacitor parallel coupled LC-tank oscillator. Vector based analysis is carried out to evaluate the general oscillating condition. Closed-form expressions for oscillation frequency and quadrature accuracy in the presence of loading are derived for the case of weak coupling. It is shown with rigorous analysis, for the first time, that the tapped-capacitor LC-tank oscillator exhibits oscillation frequency that is independent of loading conditions. The analysis clearly demonstrates that the effects of mismatch in tapped-capacitors on quadrature accuracy can be minimized by proper choice of coupling factor and shows that the error due to these tapped-capacitors is independent of the quality factor of the tank. Results from Spectre simulations are used to validate the analytical results.
  • Keywords
    LC circuits; capacitors; phase noise; voltage-controlled oscillators; LC-oscillators; Spectre simulations; closed-form expressions; general oscillating condition; load independent quadrature oscillators; oscillation frequency; quadrature accuracy mismatch; quadrature phase error; quality factor; tapped-capacitor parallel coupled oscillator; vector based analysis; Accuracy; Capacitance; Capacitors; Couplings; Loading; Oscillators; Vectors; CMOS; LC -tank; QVCO; phase-error; phase-noise; quadrature accuracy; quadrature oscillators (QOs);
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2013.2285695
  • Filename
    6690258