DocumentCode :
3598662
Title :
Measurement setup for X-Parameter characterization of bulk acoustic wave resonators
Author :
Akstaller, W. ; Tag, A. ; Musolff, C. ; Weigel, R. ; Hagelauer, A.
Author_Institution :
Inst. for Electron. Eng., Univ. of Erlangen - Nuremberg, Erlangen, Germany
fYear :
2015
Firstpage :
1
Lastpage :
3
Abstract :
In this work a modern measurement method has been utilized in order to characterize nonlinear behavior of bulk acoustic wave (BAW) solidly mounted resonators (SMR). Unlike typical nonlinearity characterization methods, the method which was employed here not only records amplitudes, but also the phase of generated harmonics. Furthermore, the relations between the harmonics of different order are given. The modeling approach being used is the poly harmonic distortion (PHD) modeling approach, realized by the measurement of X-Parameters. For that purpose it was necessary to extend a nonlinear vector network analyzer (NVNA) by external components in order to enable high power measurements. Afterwards, several optimization steps were required to perform phase calibration. This difficulty arose due to the high power incident tones and steep resonator impedance curves on the one hand and the limited power provided by the phase calibration standard on the other hand.
Keywords :
acoustic measurement; acoustic resonators; bulk acoustic wave devices; calibration; harmonic distortion; network analysers; nonlinear acoustics; optimisation; power measurement; NVNA; PHD modeling approach; X-parameter characterization; bulk acoustic wave solidly mounted resonator; modern measurement method; nonlinear behavior; nonlinear vector network analyzer; nonlinearity characterization method; optimization; phase calibration standard; poly harmonic distortion; power measurement; steep resonator impedance curve; Attenuators; Calibration; Harmonic analysis; Phase measurement; Power harmonic filters; Power measurement; Receivers; Bulk Acoustic Wave (BAW); Nonlinear Vector Network Analyzer (NVNA); X-parameters; nonlinear characterization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2015 85th
Type :
conf
DOI :
10.1109/ARFTG.2015.7162919
Filename :
7162919
Link To Document :
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