Title :
Statistical optimization of leakage power considering process variations using dual-Vth and sizing
Author :
Srivastava, Ashish ; Sylvester, Dennis ; Blaauw, David
Author_Institution :
University of Michigan, Ann Arbor, Ml
Keywords :
Algorithm design and analysis; Circuit optimization; Constraint optimization; Counting circuits; Delay; Design optimization; Performance analysis; Permission; Statistical analysis; Timing;
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Print_ISBN :
1-51183-828-8
