Title :
A solution to relax breakdown threshold in waveguide filters
Author :
Frigui, Kamel ; Bila, S. ; Baillargeat, Dominique ; Catherinot, A. ; Verdeyme, S. ; Puech, J. ; Estagerie, Laetitia ; Pacaud, Damien ; Dillenbourg, H.
Author_Institution :
XLIM, Univ. de Limoges, Limoges, France
Abstract :
While characterizing OMUX filters at atmospheric pressure, electrical breakdown can occur involuntarily and damage the equipment. The phenomenon of breakdown was studied and our objective was to propose a multi-physical modeling, in order to predict the critical input power which can generate such a microwave breakdown. In this paper we present the microwave breakdown threshold at several frequency bands and we propose a solution to relax the microwave breakdown threshold.
Keywords :
atmospheric pressure; electric breakdown; microwave filters; waveguide filters; OMUX filter characterization; atmospheric pressure; critical input power; electrical breakdown; microwave breakdown threshold; multiphysical modeling; waveguide filters; Electric breakdown; Electromagnetic heating; Fasteners; Gold; Microwave filters; Breakdown; Microwave Filters; breakdown threshold; electronic density; electronic temperature; heat diffusion; plasma physics; thermal transfer theory;
Conference_Titel :
Microwave Conference (EuMC), 2012 42nd European
Print_ISBN :
978-1-4673-2215-7
Electronic_ISBN :
978-2-87487-026-2
