• DocumentCode
    3599491
  • Title

    Freestanding submillimetre wave FSS technology

  • Author

    Dickie, R. ; Cahill, R. ; Fusco, V. ; Mitc, N.

  • Author_Institution
    Inst. of Electron., Commun. & Inf. Technol., Queen´´s Univ. Belfast, Belfast, UK
  • fYear
    2011
  • Firstpage
    1444
  • Lastpage
    1448
  • Abstract
    In this paper we report on two methods of fabricating Frequency Selective Surfaces (FSS) which are designed to give a polarisation independent band pass filter response centred at 321 GHz. One of the designs is based on metal encapsulated polymer while a later version uses silicon on insulator (SOI) as the structural material. The fabrication of the devices was carried out in a clean room laboratory using precision micromachining and plating processes. These include the use of reactive ion etching (RIE) to pattern the individual slots and deep RIE to remove the substrate underneath. This process yields a Freestanding FSS which can be duplicated to form multilayer structures with enhanced filtering performance. Quasi-optical transmission measurements in the 290 GHz - 360 GHz range yield spectral transmission coefficients which are in close agreement with the numerical predictions.
  • Keywords
    band-pass filters; frequency selective surfaces; micromachining; silicon-on-insulator; sputter etching; submillimetre wave filters; freestanding submillimetre wave FSS technology; frequency 290 GHz to 360 GHz; frequency selective surfaces; metal encapsulated polymer; micromachining process; plating process; polarisation independent band pass filter; reactive ion etching; silicon on insulator; structural material; Fabrication; Frequency selective surfaces; Polymers; Remote sensing; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation (EUCAP), Proceedings of the 5th European Conference on
  • Print_ISBN
    978-1-4577-0250-1
  • Type

    conf

  • Filename
    5781782