DocumentCode :
3599533
Title :
Modeling of a 14-bit, 100-MS/s pipelined ADC with digital nonlinearity calibration
Author :
Wang, Xuan ; Chen, Junxiao ; HE, Lenian
Author_Institution :
Inst. of VLSI Design, Zhejiang Univ., Hangzhou, China
fYear :
2009
Firstpage :
208
Lastpage :
211
Abstract :
This paper describes a digital calibration scheme for pipelined analog-to-digital converters (ADCs). The proposed method corrects the nonlinearity caused by finite gain and bandwidth of interstage operational amplifiers as well as the capacitors mismatch in multiplying digital-to-analog converters. The proposed calibration technique takes the advantages of both foreground and background calibration schemes. A behavior simulation is carried out to verify the proposed calibration scheme. Simulation results revealed that for a 14 bit, 100 MS/s pipelined ADC with 0.1% capacitor mismatch, the INL could be limited within ±1.2 LSB and a 76.8 dB SNDR is achieved, due to proposed digital calibration technique.
Keywords :
analogue-digital conversion; calibration; digital-analogue conversion; operational amplifiers; background calibration schemes; capacitors mismatch; digital calibration scheme; digital nonlinearity calibration; digital-to-analog converters; foreground calibration schemes; interstage operational amplifiers; pipelined ADC modelling; pipelined analog-to-digital converters; Analog-digital conversion; Calibration; Capacitors; Helium; MOS devices; Operational amplifiers; Pipelines; Sampling methods; Very large scale integration; Voltage; Pipelined ADC; digital calibration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Circuits, ISIC '09. Proceedings of the 2009 12th International Symposium on
Print_ISBN :
978-9-8108-2468-6
Type :
conf
Filename :
5403719
Link To Document :
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