Title :
The influence of electrical impulse on IC transient radiation-induced effects
Author :
Chumakov, Alexander I. ; Skorobogatov, P.K. ; Artamonov, A.S. ; Barbashov, V.M.
Keywords :
CMOS integrated circuits; Circuit simulation; Computational modeling; Computer simulation; Failure analysis; Power supplies; Pulsed power supplies; System testing; Threshold voltage; Time factors;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Print_ISBN :
92-9092-846-8
