Title :
A Novel Temperature Stable Current Mode Bandgap for Wide Range of Supply Voltage Variation
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol. Madras, Chennai, India
Abstract :
A curvature corrected bandgap reference (BGR) capable of generating sub-1-V output in standard CMOS process is proposed. It has the advantage over the prior arts in terms of accuracy of output voltage over wide temperature range while input supply voltage can undergo a large variation from 3 V to 1.5 V. Curvature correction of this BGR was done in a unique way by utilizing the temperature dependence of the base current in bipolar junction transistor (BJT). Stability of output voltage over wide range of supply voltage was ensured by using an improved self-biased amplifier. Spectre simulation of the proposed circuit showed that the output reference voltage at 716 mV has a temperature coefficient less than or equal to 2.7 ppm/°C over -55°C to 125°C. Line regulation of the output reference voltage is less than 0.028% per Volt while supply voltage varies from 3 V to 1.5 V. Compatibility of proposed bandgap at different technologies was confirmed by simulating the circuit in 0.18μ and 0.22μ CMOS process.
Keywords :
CMOS integrated circuits; amplifiers; bipolar transistors; current-mode circuits; energy gap; reference circuits; BJT; CMOS process; bipolar junction transistor; complementary metal oxide semiconductor; curvature corrected bandgap reference; line regulation; self-biased amplifier; size 0.18 mum; size 0.22 mum; spectre simulation; supply voltage variation; temperature coefficient; temperature dependence; temperature stable current mode bandgap; voltage 3 V to 1.5 V; voltage 716 mV; voltage stability; Accuracy; CMOS integrated circuits; CMOS process; Photonic band gap; Temperature dependence; Temperature distribution; Voltage reference; bandgap reference; curvature compensation; input common mode voltage; temperature coefficient;
Conference_Titel :
Electronic System Design (ISED), 2014 Fifth International Symposium on
Print_ISBN :
978-1-4799-6964-7
DOI :
10.1109/ISED.2014.16
