DocumentCode :
3599627
Title :
Hardware Implementation and Testing of Log-MAPP Decoder Based on Novel Un-grouped Sliding-Window Technique
Author :
Shrestha, Rahul ; Paily, Roy
Author_Institution :
Dept. of Electron. & Electr. Eng. (EEE), Indian Inst. of Technol. Guwahati (IITG), Guwahati, India
fYear :
2014
Firstpage :
171
Lastpage :
175
Abstract :
This paper proposes a un-grouped-sliding-window-technique (UGSWT) and a state metric normalization technique for logarithmic maximum-a-posteriori-probability (LMAPP) algorithm. We have suggested a decoder architecture based on these techniques for high throughput application. Application-specific-integrated-circuit (ASIC) implementation of the proposed decoder is carried out in 90 nm complementary-metal-oxide-semiconductor (CMOS) process and it has achieved a throughput of 612 Mbps at a maximum clock frequency of 625 MHz with an energy efficiency of 0.1 nJ/bit. Functional verification of the implemented channel decoder is carried out using field-programmable gate-array (FPGA) which is interconnected with logic analyzer via high-speed-data-transfer card. Bit-error-rate (BER) performance of the implemented decoder has shown a coding loss of approximately 0.2 dB in comparison with the simulated BER values.
Keywords :
CMOS integrated circuits; application specific integrated circuits; decoding; error statistics; field programmable gate arrays; integrated circuit testing; logic analysers; maximum likelihood estimation; ASIC; BER performance; CMOS process; FPGA; UGSWT; application-specific-integrated-circuit; bit-error-rate; channel decoder; complementary-metal-oxide-semiconductor process; field-programmablegate-array; frequency 625 MHz; functional verification; high-speed-data-transfer card; log-MAPP decoder testing; logarithmic maximum-a-posteriori-probability algorithm; logic analyzer; size 90 nm; state metric normalization technique; ungrouped sliding-window technique; Bit error rate; Clocks; Computer architecture; Decoding; Throughput; Timing; LMAPP algorithm; VLSI design; sliding window technique; turbo code and BER performance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic System Design (ISED), 2014 Fifth International Symposium on
Print_ISBN :
978-1-4799-6964-7
Type :
conf
DOI :
10.1109/ISED.2014.42
Filename :
7172769
Link To Document :
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