DocumentCode
3599793
Title
Transistors for VLSI, for wireless: A view forwards through fog
Author
Rodwell, M.J.W. ; Huang, C.-Y. ; Rode, J. ; Choudhary, P. ; Lee, S. ; Gossard, A.C. ; Long, P. ; Wilson, E. ; Mehrotra, S. ; Povolotskyi, M. ; Klimeck, G. ; Urteaga, M. ; Brar, B. ; Chobpattanna, V. ; Stemmer, S.
Author_Institution
ECE Depts., Univ. of California, Santa Barbara, Santa Barbara, CA, USA
fYear
2015
Firstpage
19
Lastpage
20
Abstract
Summary form only given. For VLSI, transistors are made small, making them plentiful (cheap) and the wires connecting them short, with low delay (CVDD/I), and low switching energy (CVDD2/2); small-area electronics is key. Low power demands low VDD yet low Ioff . Below threshold, we seek characteristics steeper than thermal; above it, dI/dV should be large. Tunnel FETs [1] are the most studied steep transistors. Yet, in nm TFETs, quantization increases barrier energies and nonparabolicy increases carrier mass. WKB hand calculations predict only 10% tunneling probability for a 2nm barrier, 1% for 4nm. The barrier thickness is not easily reduced, being set by the source doping and channel and dielectric thicknesses, hence on-current and logic speed will be low. Adding a second barrier [2] introduces a bound state, and dI/dV peaks as the state aligns with the source. A multi-layer electron anti-reflection coating (fig.1) [3], increases transmission over a broad energy range; design parallels microwave impedance-matching.
Keywords
VLSI; antireflection coatings; field effect transistors; impedance matching; microwave integrated circuits; probability; semiconductor doping; tunnel transistors; TFET; VLSI transistors; WKB hand calculation; barrier energy; low delay; low switching energy; microwave impedance matching; multilayer electron antireflection coating; size 2 nm; small-area electronics; source doping; steep transistors; tunnel FET; tunneling probability; Dielectrics; Logic gates; MOSFET; Tunneling; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference (DRC), 2015 73rd Annual
Print_ISBN
978-1-4673-8134-5
Type
conf
DOI
10.1109/DRC.2015.7175529
Filename
7175529
Link To Document