• DocumentCode
    3599793
  • Title

    Transistors for VLSI, for wireless: A view forwards through fog

  • Author

    Rodwell, M.J.W. ; Huang, C.-Y. ; Rode, J. ; Choudhary, P. ; Lee, S. ; Gossard, A.C. ; Long, P. ; Wilson, E. ; Mehrotra, S. ; Povolotskyi, M. ; Klimeck, G. ; Urteaga, M. ; Brar, B. ; Chobpattanna, V. ; Stemmer, S.

  • Author_Institution
    ECE Depts., Univ. of California, Santa Barbara, Santa Barbara, CA, USA
  • fYear
    2015
  • Firstpage
    19
  • Lastpage
    20
  • Abstract
    Summary form only given. For VLSI, transistors are made small, making them plentiful (cheap) and the wires connecting them short, with low delay (CVDD/I), and low switching energy (CVDD2/2); small-area electronics is key. Low power demands low VDD yet low Ioff . Below threshold, we seek characteristics steeper than thermal; above it, dI/dV should be large. Tunnel FETs [1] are the most studied steep transistors. Yet, in nm TFETs, quantization increases barrier energies and nonparabolicy increases carrier mass. WKB hand calculations predict only 10% tunneling probability for a 2nm barrier, 1% for 4nm. The barrier thickness is not easily reduced, being set by the source doping and channel and dielectric thicknesses, hence on-current and logic speed will be low. Adding a second barrier [2] introduces a bound state, and dI/dV peaks as the state aligns with the source. A multi-layer electron anti-reflection coating (fig.1) [3], increases transmission over a broad energy range; design parallels microwave impedance-matching.
  • Keywords
    VLSI; antireflection coatings; field effect transistors; impedance matching; microwave integrated circuits; probability; semiconductor doping; tunnel transistors; TFET; VLSI transistors; WKB hand calculation; barrier energy; low delay; low switching energy; microwave impedance matching; multilayer electron antireflection coating; size 2 nm; small-area electronics; source doping; steep transistors; tunnel FET; tunneling probability; Dielectrics; Logic gates; MOSFET; Tunneling; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2015 73rd Annual
  • Print_ISBN
    978-1-4673-8134-5
  • Type

    conf

  • DOI
    10.1109/DRC.2015.7175529
  • Filename
    7175529