• DocumentCode
    3599974
  • Title

    Protocol test sequence generation using UIO and BUIO

  • Author

    Choi, Yunghee ; Kim, Dongkyun ; Kim, Jaecheol ; Park, Yongbum ; Chung, Ilyoung

  • Author_Institution
    Seoul Nat. Univ., South Korea
  • Volume
    1
  • fYear
    1995
  • Firstpage
    362
  • Abstract
    With the proliferation of computer communications, new protocols are introduced at an increasing rate. It is therefore more important than ever before that efficient methods be available to verify the protocol implementations´ correctness and conformity to the specifications. In protocol conformance testing, it is crucial to have short and efficient protocol test sequences for faster processing. We introduce here two approaches to generate test sequences; one based on UIO (unique input/output) sequence, and the other using BUIO (backward UIO) sequence. For each category, two different algorithms have been developed; one utilizing the segment overlapping between transitions under test, and the other exploiting the multiplicity of UIO/BUIOs for each node. BUIO, in contrast to the UIO which is a distinguishing sequence following the node under investigation, identifies a node with a sequence that leads into it. Experiments show that significant gain in the test sequence length can be obtained with the proposed algorithms
  • Keywords
    conformance testing; protocols; telecommunication computing; BUIO sequence; UIO sequence; algorithms; backward UIO; computer communications; distinguishing sequence; experiments; finite state machine; node under investigation; protocol conformance testing; protocol test sequence generation; segment overlapping; test sequence length; transitions under test; unique input/output; Automata; Character generation; Computational complexity; Electronic equipment testing; Heuristic algorithms; Humans; Protocols;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications, 1995. ICC '95 Seattle, 'Gateway to Globalization', 1995 IEEE International Conference on
  • Print_ISBN
    0-7803-2486-2
  • Type

    conf

  • DOI
    10.1109/ICC.1995.525194
  • Filename
    525194