Title :
Binarization of spectral histogram models: An application to efficient biometric identification
Author :
Pflug, Anika ; Rathgeb, Christian ; Scherhag, Ulrich ; Busch, Christoph
Author_Institution :
da/sec - Biometrics & Internet Secrity Res. Group, Darmstadt, Germany
Abstract :
Feature extraction techniques such as local binary patterns (LBP) or binarized statistical image features (BSIF) are crucial components in a biometric recognition system. The vast majority of relevant approaches employs spectral histograms as feature representation, i.e. extracted biometric reference data consists of sequences of histograms. Transforming these histogram sequences to a binary representation in an accuracy-preserving manner would offer major advantages w.r.t. data storage and efficient comparison. We propose a generic binarization for spectral histogram models in conjunction with a Hamming distance-based comparator. The proposed binarization and comparison technique enables a compact storage and a fast comparison of biometric features at a negligible cost of biometric performance (accuracy). Further, we investigate a serial combination of the binary comparator and histogram model-based comparator in a biometric identification system. Experiments are carried out for two emerging biometric characteristics, i.e. palmprint and ear, confirming the soundness of the presented technique.
Keywords :
ear; feature extraction; image representation; palmprint recognition; BSIF; Hamming distance-based comparator; LBP; binarized statistical image features; binary comparator; biometric identification; biometric recognition system; ear recognition; feature extraction techniques; feature representation; histogram model-based comparator; local binary patterns; palmprint recognition; spectral histogram model binarization; Biological system modeling; Biometrics (access control); Databases; Ear; Feature extraction; Histograms; Reliability; binarization; biometrics; cascaded search; ear Recognition; palm print recognition;
Conference_Titel :
Cybernetics (CYBCONF), 2015 IEEE 2nd International Conference on
Print_ISBN :
978-1-4799-8320-9
DOI :
10.1109/CYBConf.2015.7175985