FDTD application to the electrical characterization of materials by solving an inverse problem

Author

Grando, J. ; Ferrieres, X. ; Levesque, P. ; Issac, F. ; Alliot, J.C.

Author_Institution

Dept. of Phys., ONERA, Chatillon, France

Volume

2

fYear

1997

Firstpage

974

Abstract

We present a method in order to obtain the unknown permittivity and conductivity of a homogeneous object. The object is illuminated by an electromagnetic plane wave and we measure a set of near scattered fields with the EMIR (electromagnetic infrared) method. This experimental method is based on the use of photothermic film as a sensor to measure electromagnetic fields. With the field data available, we can formulate an inverse problem to evaluate the electrical characteristics of the studied object. To solve the inverse problem, we use an iterative scheme based on a finite difference time domain method for the direct problem.

Keywords

electrical conductivity measurement; electromagnetic wave scattering; finite difference time-domain analysis; infrared imaging; inverse problems; iterative methods; permittivity measurement; EMIR; FDTD application; IR thermography; conductivity; direct problem; electrical characterization; electromagnetic infrared method; electromagnetic plane wave; finite difference time domain method; homogeneous object; inverse problem; iterative scheme; near scattered fields; permittivity; photothermic film; Conducting materials; Conductivity; Electromagnetic fields; Electromagnetic measurements; Electromagnetic scattering; Finite difference methods; Inverse problems; Permittivity measurement; Sensor phenomena and characterization; Time domain analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium, 1997. IEEE., 1997 Digest

Print_ISBN

0-7803-4178-3

Type

conf

DOI

10.1109/APS.1997.631690

Filename

631690