• DocumentCode
    3600708
  • Title

    Design of n-Tier Multilevel Interconnect Architectures by Using Carbon Nanotube Interconnects

  • Author

    Farahani, Esmat Kishani ; Sarvari, Reza

  • Author_Institution
    Sharif Univ. of Technol., Tehran, Iran
  • Volume
    23
  • Issue
    10
  • fYear
    2015
  • Firstpage
    2128
  • Lastpage
    2134
  • Abstract
    In this paper, n-tier methodology is developed to design multilevel interconnect architecture of macrocells using single-wall carbon nanotube (SWCNT) bundles. Upper limit of low-bias voltage of SWCNT bundle interconnects is derived and its dependence on temperature, SWCNTs´ diameter, and interconnect length is studied. Possibility of using SWCNT bundles as local interconnects at 7.5-nm technology node is discussed, and it is shown that SWCNT bundles with 1 nm diameter cannot be used at the first interconnect metal level. Using Cu and SWCNT bundles, multilevel interconnect architecture of a 7.5-nm ASIC macrocell is designed which reduces the number of metal levels by 27% and power dissipation by 25% compared with the multilevel interconnect architecture designed with only Cu. The effect of aspect ratio (AR) on the n-tier design is studied. It is shown that decreasing AR of SWCNT bundle interconnects, decreases total power dissipation of the ASIC macrocell by 41%. The impact of temperature variation on the design of multilevel interconnect architecture is also investigated.
  • Keywords
    application specific integrated circuits; integrated circuit design; integrated circuit interconnections; single-wall carbon nanotubes; SWCNT bundles; aspect ratio; carbon nanotube interconnects; macrocells; n-tier multilevel interconnect architectures; single-wall carbon nanotube; size 7.5 nm; Application specific integrated circuits; Computer aided software engineering; Macrocell networks; Metals; Power dissipation; Repeaters; Wires; Carbon nanotube (CNT); low-bias regime; multilevel interconnect architecture; n-tier methodology; temperature variation; temperature variation.;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2014.2360713
  • Filename
    6922588