• DocumentCode
    3600733
  • Title

    Many-Core Processors Granularity Evaluation by Considering Performance, Yield, and Lifetime Reliability

  • Author

    Jianming Yu ; Wei Zhou ; Yueming Yang ; Xiaodong Zhang ; Zhiyi Yu

  • Author_Institution
    Dept. of Microelectron., Fudan Univ., Shanghai, China
  • Volume
    23
  • Issue
    10
  • fYear
    2015
  • Firstpage
    2043
  • Lastpage
    2053
  • Abstract
    Network-on-chip based many-core processors break the limitations faced with single-core processors, and can bring high performance, improved yield, and high reliability. They are widely considered as the most promising platform. One of the most important questions is: what kind of granularity of cores (in other words, the number of cores and the area of each core under specific area constraint of the chip) is the best for many-core processors? Performance is widely used as the most important metric to determine the choice, but recently, reliability and yield are also becoming the first-class constraints in many application domains. This paper presents a novel performance model by considering practical program style, including pipelined and parallel program styles, as well as intercore communication, and proposes a new metric combing performance, reliability, and yield of many-core processors to choose the core granularity. According to our paper, with a given area (300 mm2) and certain applications, the optimal result is obtained using 8 × 8 mesh when all three factors are considered.
  • Keywords
    integrated circuit reliability; multiprocessing systems; network-on-chip; core granularity; intercore communication; lifetime reliability; many-core processors granularity evaluation; network-on-chip based many-core processors; single-core processors; Analytical models; Mathematical model; Measurement; Pipelines; Program processors; Reliability; System performance; Granularity; lifetime reliability; many-core system; metric; performance; yield; yield.;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2014.2359076
  • Filename
    6933912